232 search results - page 41 / 47 » Using a logical model to predict the growth of yeast |
SIAMSC
2008
13 years 7 months ago
2008
Abstract. Most technologically useful materials possess polycrystalline microstructures composed of a large number of small monocrystalline grains separated by grain boundaries. Th...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
- Power consumption is one of the major challenges in VLSI Design. Power constrained designs need tools to accurately predict the power consumption and provide feedback to designer...
FPGA
2006
ACM
13 years 11 months ago
2006
ACM
In this paper, we propose a technique to flexibly implement genetic algorithms for various problems on FPGAs. For the purpose, we propose a basic architecture for GA which consist...