The advances in wireless communication and decreasing costs of mobile devices have enabled users to access desired information at any time. Coupled with positioning technologies l...
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...
Anant Vishnoi, Preeti Ranjan Panda, M. Balakrishna...
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
Lide Zhang, Lan S. Bai, Robert P. Dick, Li Shang, ...
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...