Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Parallel counters are key elements in many arithmetic circuits, especially fast multipliers. In this paper, novel architectures and designs for high speed, low power (3, 2), (7, 3...
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects that leakage power consumption may come to dominate total chip power consumption as...
Jun-Cheol Park, Vincent John Mooney III, Philipp P...
The multiplication of a variable by multiple constants, i.e., the multiple constant multiplications (MCM), has been a central operation and performance bottleneck in many applicat...