Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
Power grid verification in modern integrated circuits is an integral part of early system design where adjustments can be most easily incorporated. In this work, we describe an ea...
In this paper we consider the important problem of noise analysis of non-autonomous nonlinear RF circuits in presence of input signal phase noise. We formulate this problem as a s...
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...