226 search results - page 8 / 46 » Variation-tolerant circuits: circuit solutions and technique... |
DAC
1995
ACM
14 years 1 days ago
1995
ACM
Abstract We observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays. As a result, sligh...
TCAD
1998
13 years 8 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
DAC
2009
ACM
14 years 11 days ago
2009
ACM
Power grid verification in modern integrated circuits is an integral part of early system design where adjustments can be most easily incorporated. In this work, we describe an ea...
ICCAD
1999
IEEE
14 years 24 days ago
1999
IEEE
In this paper we consider the important problem of noise analysis of non-autonomous nonlinear RF circuits in presence of input signal phase noise. We formulate this problem as a s...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Core-based system-on-chips (SoCs) fabricated on threedimensional (3D) technology are emerging for better integration capabilities. Effective test architecture design and optimizat...