5348 search results - page 71 / 1070 » Variational surface modeling |
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 2 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
ICPR
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper 1 proposes a technique for simplifying a given Gaussian mixture model, i.e. reformulating the density in a more parcimonious manner, if possible (less Gaussian componen...
SCALESPACE
2009
Springer
14 years 2 months ago
2009
Springer
Abstract. We wish to recover an image corrupted by blur and Gaussian or impulse noise, in a variational framework. We use two data-fidelity terms depending on the noise, and sever...
ASPDAC
2007
ACM
13 years 12 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...