584 search results - page 8 / 117 » Verification-Aware Microprocessor Design |
TVLSI
2002
13 years 8 months ago
2002
This paper presents the development of instruction analysis/scheduling CAD techniques to measure the distribution of functional unit usage and the micro operation level parallelis...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
CASES
2006
ACM
14 years 20 days ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
CDES
2006
13 years 10 months ago
2006
- Error detection plays an important role in fault-tolerant computer systems. Two primary parameters concerned for error detection are the latency and coverage. In this paper, a ne...
TCAD
2008
13 years 8 months ago
2008
Abstract--Thermal issues are fast becoming major design constraints in high-performance systems. Temperature variations adversely affect system reliability and prompt worst-case de...