584 search results - page 98 / 117 » Verification-Aware Microprocessor Design |
DSN
2007
IEEE
14 years 2 months ago
2007
IEEE
— Device scaling and large integration increase the vulnerability of microprocessors to transient errors. One of the structures where errors can be most harmful is the register ...
DSN
2007
IEEE
14 years 2 months ago
2007
IEEE
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
ICCD
2007
IEEE
14 years 2 months ago
2007
IEEE
Leakage power has grown significantly and is a major challenge in microprocessor design. Leakage is the dominant power component in second-level (L2) caches. This paper presents t...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
VLSI
2007
Springer
14 years 1 months ago
2007
Springer
— In the future, high performance computing systems may consist of multiple multicore processors and reconfigurable logic coprocessors. Industry trends indicate that such coproc...