1093 search results - page 133 / 219 » Verifying VLSI Circuits |
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
FMSD
2010
13 years 7 months ago
2010
In this paper, we consider verifying properties of mixed-signal circuits, i.e., circuits for which there is an interaction between analog (continuous) and digital (discrete) values...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
3-dimensional integrated circuit (3D IC) technology places circuit blocks in the vertical dimension in addition to the conventional horizontal plane. Compared to conventional plan...
SLIP
2005
ACM
14 years 2 months ago
2005
ACM
Routability optimization has become a major concern in the physical design cycle of VLSI circuits. Due to the recent advances in VLSI technology, interconnect has become a dominan...