1093 search results - page 178 / 219 » Verifying VLSI Circuits |
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
ICCAD
1996
IEEE
14 years 29 days ago
1996
IEEE
We presenta new representationfor Boolean functions called PartitionedROBDDs. In this representation we divide the Boolean space into `k' partitions and represent a function ...
FDTC
2006
Springer
14 years 14 days ago
2006
Springer
Abstract. Balanced gates are an effective countermeasure against power analysis attacks only if they can be guaranteed to maintain their power balance. Traditional testing and reli...
TVLSI
2008
13 years 8 months ago
2008
Data stability of SRAM cells has become an important issue with the scaling of CMOS technology. Memory banks are also important sources of leakage since the majority of transistors...
ET
2010
13 years 7 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...