1093 search results - page 192 / 219 » Verifying VLSI Circuits |
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ISLPED
2005
ACM
14 years 1 months ago
2005
ACM
This paper explores the power implications of replacing global chip wires with an on-chip network. We optimize network links by varying repeater spacing, link pipelining, and volt...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Gate oxide tunneling current Igate and sub-threshold current Isub dominate the leakage of designs. The latter depends on threshold voltage Vth while Igate vary with the thickness ...
GECCO
2004
Springer
14 years 29 days ago
2004
Springer
Multiplicative general parameter (MGP) approach to finite impulse response (FIR) filtering introduces a novel way to realize cost effective adaptive filters in compact very large s...