1093 search results - page 193 / 219 » Verifying VLSI Circuits |
LCN
2003
IEEE
14 years 25 days ago
2003
IEEE
Optoelectronic integrated circuits can support thousands of integrated optical laser diodes and photodetectors bonded to a high-performance CMOS substrate, and can be used in the ...
ISLPED
2003
ACM
14 years 24 days ago
2003
ACM
A significant fraction of the total power in highly synchronous systems is dissipated over clock networks. Hence, low-power clocking schemes would be promising approaches for futu...
ISLPED
2003
ACM
14 years 24 days ago
2003
ACM
Power dissipation is unevenly distributed in modern microprocessors leading to localized hot spots with significantly greater die temperature than surrounding cooler regions. Exc...
CASES
2009
ACM
14 years 7 days ago
2009
ACM
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
ASPDAC
2000
ACM
13 years 12 months ago
2000
ACM
- This paper presents a new aged timing simulation methodology that can be used for hot-carrier reliability assurance of VLSI. This methodology consists of a compact model and a un...