1093 search results - page 33 / 219 » Verifying VLSI Circuits |
62
Voted
DATE
2006
IEEE
15 years 8 months ago
2006
IEEE
ICCAD
1996
IEEE
15 years 7 months ago
1996
IEEE
134
Voted
CAV
1991
Springer
15 years 6 months ago
1991
Springer
202
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
94
Voted
VLSID
2004
IEEE
16 years 3 months ago
2004
IEEE