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1093
search results - page 33 / 219
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Verifying VLSI Circuits
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DATE
2006
IEEE
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Verifying analog oscillator circuits using forward/backward abstraction refinement
14 years 2 months ago
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Goran Frehse, Bruce H. Krogh, Rob A. Rutenbar
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ICCAD
1996
IEEE
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ICCAD 1996
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ACV: an arithmetic circuit verifier
14 years 27 days ago
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Yirng-An Chen, Randal E. Bryant
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CAV
1991
Springer
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Mechanically Verifying Safety and Liveness Properties of Delay Insensitive Circuits
14 years 8 days ago
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David M. Goldschlag
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Within-die Process Variations: How Accurately can They Be Statistically Modeled?
15 years 8 months ago
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scale.engin.brown.edu
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
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VLSID
2004
IEEE
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VLSI
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VLSID 2004
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Quantitative Model for Thermal Behaviour of an Analog Integrated Circuit
14 years 9 months ago
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www.columbia.edu
Gagandeep S. Sandha, Pawan K. Singh, C. Pradeep Ku...
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