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» Verifying VLSI Circuits
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ICCAD
1996
IEEE
93views Hardware» more  ICCAD 1996»
14 years 27 days ago
ACV: an arithmetic circuit verifier
Yirng-An Chen, Randal E. Bryant

Publication
576views
15 years 8 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
VLSID
2004
IEEE
75views VLSI» more  VLSID 2004»
14 years 9 months ago
Quantitative Model for Thermal Behaviour of an Analog Integrated Circuit
Gagandeep S. Sandha, Pawan K. Singh, C. Pradeep Ku...