1093 search results - page 57 / 219 » Verifying VLSI Circuits |
VLSID
1999
IEEE
14 years 2 months ago
1999
IEEE
To minimize the time to market and cost of new sub 0.25um process technologies and products, PDF Solutions, Inc., has developed a new comprehensive approach based on the use of pr...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
This paper presents a new method to compute the probability distribution of the delay of a combinational circuit and uses it obtain an estimate of the yield of the process that ma...
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
Variabilities in metal interconnect structures can affect circuit timing performance or even cause function failure in VLSI designs. This paper proposes a method to estimate the ...
DFT
2005
IEEE
14 years 3 months ago
2005
IEEE
SRAM-based Field Programmable Gate Arrays (FPGAs) are very susceptible to Single Event Upsets (SEUs) that may have dramatic effects on the circuits they implement. In this paper w...