1093 search results - page 75 / 219 » Verifying VLSI Circuits |
VTS
2003
IEEE
14 years 3 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
SBCCI
2003
ACM
14 years 3 months ago
2003
ACM
As we scale down to deep submicron (DSM) technology, noise is becoming a metric of equal importance as power, speed, and area. Smaller feature sizes, low voltage, and high frequen...
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
ISVLSI
2002
IEEE
14 years 2 months ago
2002
IEEE
Retiming has been shown to be a powerful technique for improving the performance of synchronous circuits. However, even though retiming algorithms of polynomial time complexity ha...
DFT
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...