1093 search results - page 81 / 219 » Verifying VLSI Circuits |
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
VLSID
2007
IEEE
14 years 4 months ago
2007
IEEE
As the VLSI technology scales towards the nanometer regime, circuit performance is increasingly affected by variations. These variations need to be considered at an early stage in...
GLVLSI
2006
IEEE
14 years 4 months ago
2006
IEEE
A sensitivity analysis of resonant H-tree clock distribution networks is presented in this paper for a TSMC 0.18 μm CMOS technology. The analysis focuses on the effect of the dri...
GLVLSI
2005
IEEE
14 years 3 months ago
2005
IEEE
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
GLVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
A new split accumulator architecture to be used in direct digital frequency synthesizers (DDFS) systems is presented. This new design eliminates the need of adders on the section ...