1093 search results - page 98 / 219 » Verifying VLSI Circuits |
ICCD
1997
IEEE
14 years 3 months ago
1997
IEEE
Simulated annealing based standard cell placement for VLSI designs has long been acknowledged as a compute-intensive process. All previous work in parallel simulated annealing bas...
ARCS
2006
Springer
14 years 2 months ago
2006
Springer
State-of-the-art technologies in very large scale integration (VLSI) allow for the realization of gates with varying energy consumptions and hence delays (i.e., processing speeds) ...
TVLSI
1998
13 years 10 months ago
1998
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efï...
VLSID
2007
IEEE
14 years 11 months ago
2007
IEEE
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
VLSID
2005
IEEE
14 years 11 months ago
2005
IEEE
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...