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DATE
2000
IEEE
121views Hardware» more  DATE 2000»
14 years 4 days ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
CTRSA
2010
Springer
169views Cryptology» more  CTRSA 2010»
14 years 2 months ago
Hash Function Combiners in TLS and SSL
Abstract. The TLS and SSL protocols are widely used to ensure secure communication over an untrusted network. Therein, a client and server first engage in the so-called handshake ...
Marc Fischlin, Anja Lehmann, Daniel Wagner
ISCAS
2006
IEEE
80views Hardware» more  ISCAS 2006»
14 years 1 months ago
Fundamental limitations of continuous-time delta-sigma modulators due to clock jitter
We examine noise due to clock jitter in single-loop low pass continuous-time delta-sigma modulators employing NRZ feedback DACs. Using the discrete-time version of the Bode sensit...
K. Reddy, S. Pavan
ISM
2006
IEEE
163views Multimedia» more  ISM 2006»
14 years 1 months ago
Digital Camera Resolution: An Improved Heisenberg-Gabor Testing Method
The paper demonstrates a method of simultaneously testing the spatial and tonal resolution of a camera. Unlike the modulation transfer function which has been used in the past, th...
Corey Manders, Steve Mann
DATE
2006
IEEE
73views Hardware» more  DATE 2006»
14 years 1 months ago
Double-sampling single-loop sigma-delta modulator topologies for broadband applications
This paper presents novel double sampling high order single-loop sigma-delta modulator structures for wideband applications. To alleviate the quantization noise folding into the i...
Mohammad Yavari, Omid Shoaei, Ángel Rodr&ia...