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ITC
1998
IEEE
94views Hardware» more  ITC 1998»
14 years 25 days ago
A method of serial data jitter analysis using one-shot time interval measurements
A method for measuring inter-symbol interference, duty cycle distortion, random jitter and periodic jitter is described. The Blackman-Tukey method of signal analysis is used. This...
Jan B. Wilstrup

Presentation
3660views
15 years 9 months ago
Robust Centerline Extraction Framework Using Level Sets
In this paper, we present a novel framework for computing centerlines for both 2D and 3D shape analysis. The framework works as follows: an object centerline point is selected auto...
M. Sabry Hassouna

Publication
1500views
15 years 9 months ago
Robust Centerline Extraction Framework Using Level Sets
In this paper, we present a novel framework for computing centerlines for both 2D and 3D shape analysis. The framework works as follows: an object centerline point is selected aut...
M. Sabry Hassouna, Aly A. Farag
TC
2008
13 years 8 months ago
Adaptive Channel Buffers in On-Chip Interconnection Networks - A Power and Performance Analysis
On-chip interconnection networks (OCINs) have emerged as a modular and scalable solution for wire delay constraints in deep submicron VLSI design. OCIN research has shown that the ...
Avinash Karanth Kodi, Ashwini Sarathy, Ahmed Louri
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
14 years 23 days ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey