38 search results - page 1 / 8 » Within-die Process Variations: How Accurately can They Be St... |
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
ICML
2004
IEEE
14 years 9 months ago
2004
IEEE
Variational inference methods, including mean field methods and loopy belief propagation, have been widely used for approximate probabilistic inference in graphical models. While ...
ICCAD
2004
IEEE
14 years 5 months ago
2004
IEEE
9, IO]. However, unlike the case with static timing, it is not so easy We show how recent advances in the handling of correlated interval representations of range uncertainty can b...
ASPDAC
2009
ACM
14 years 3 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...