63 search results - page 4 / 13 » Wrapper design for embedded core test |
DT
2002
13 years 7 months ago
2002
HASE
2002
IEEE
14 years 12 days ago
2002
IEEE
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
VTS
2002
IEEE
14 years 11 days ago
2002
IEEE
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...