215 search results - page 28 / 43 » Yield-driven iterative robust circuit optimization algorithm |
ACCV
2010
Springer
13 years 2 months ago
2010
Springer
Abstract. Robust foreground object segmentation via background modelling is a difficult problem in cluttered environments, where obtaining a clear view of the background to model i...
CRV
2005
IEEE
14 years 1 months ago
2005
IEEE
The extraction of optimal features, in a classification sense, is still quite challenging in the context of large-scale classification problems (such as visual recognition), inv...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
Existing value function approximation methods have been successfully used in many applications, but they often lack useful a priori error bounds. We propose a new approximate bili...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
In the digital VLSI cycle, logic transformations are often required to modify the design to meet different synthesis and optimization goals. Logic transformations on sequential ci...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....