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ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
ICFP
2005
ACM
14 years 7 months ago
2005
ACM
Applied Type System (ATS) is recently proposed as a framework for designing and formalizing (advanced) type systems in support of practical programming. In ATS, the definition of ...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we present a methodology that uses the moments of a generic crosstalk pulse signal to derive upper bounds on the amplitude of crosstalk pulse in arbitrary interconn...