181 search results - page 30 / 37 » dac 2005 |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper proposes a low power technique, called SBR (Sign Bit Reduction) which may reduce the switching activity in multipliers as well as data buses. Utilizing the multipliers ...