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2000
IEEE
112views Hardware» more  DATE 2000»
13 years 11 months ago
The Road to Better Reliability and Yield Embedded DfM Tools
This paper gives an overview of the different tools, needed for accomplishing optimal IC manufacturability and rapid technology learning during the successive phases of process ma...
Kees Veelenturf
DATE
2000
IEEE
105views Hardware» more  DATE 2000»
13 years 11 months ago
Yield Improvement and Repair Trade-Off for Large Embedded Memories
In this paper, we give an overview of the trade-off to improve yield and optimize silicon manufacturing cost. The specific technology focus is on large embedded memories in comple...
Yervant Zorian
DATE
2000
IEEE
98views Hardware» more  DATE 2000»
13 years 11 months ago
Automatic Lighthouse Generation for Directed State Space Search
Previous researchers have suggested the use of “lighthouses” to act as guides in directed state space search. The drawback of using lighthouses is that the user has to manuall...
Praveen Yalagandula, Adnan Aziz, Vigyan Singhal
FLAIRS
2000
13 years 8 months ago
Defining and Monitoring Knowledge Integrity
Knowledgemanagementhas been claimed as the correct response to rapid change. Decisions need to be madein light of up to date knowledge. The changing nature of the knowledgeraises ...
Fatma Mili, Krish Narayanan, Vamsi Atluri
DATE
2000
IEEE
108views Hardware» more  DATE 2000»
13 years 11 months ago
Automatic Abstraction for Worst-Case Analysis of Discrete Systems
c Abstraction for Worst-Case Analysis of Discrete Systems Felice Balarin Cadence Berkeley Laboratories Recently, a methodology for worst-case analysis of discrete systems has been...
Felice Balarin