The main contribution of this work is an analytical model for finding the upper bound on the temperature difference among various locations on the die. The proposed model can be u...
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
Due to the large contribution of the memory subsystem to total system power, the memory subsystem is highly amenable to customization for reduced power/energy and/or improved perf...
Pablo Viana, Ann Gordon-Ross, Edna Barros, Frank V...
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...