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ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- 3D IC technologies can help to improve circuit performance and lower power consumption by reducing wirelength. Also, 3D IC technology can be used to realize heterogeneous system-...
BROADNETS
2007
IEEE
14 years 1 months ago
2007
IEEE
—Epidemic protocols assume that information of a random set of nodes is provided at each protocol round. By definition, the random set needs to be chosen uniformly and randomly ...
WWW
2007
ACM
14 years 8 months ago
2007
ACM
Schema statements in OWL are interpreted quite differently from analogous statements in relational databases. If these statements are meant to be interpreted as integrity constrai...
ATAL
2007
Springer
14 years 1 months ago
2007
Springer
Interdependent values (IDV) is a valuation model allowing bidders in an auction to express their value for the item(s) to sell as a function of the other bidders’ information. W...