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ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
ions", in IEEE Transactions on CAD of VLSI, 25(3):403-412, March, 2006. , E. Mercer, C. Myers, "Modular Verification of Timed Systems Using Automatic Abstraction" in...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
— We model the power fluctuation as cycle-to-cycle power gradient and minimize the mean of the power gradients using ILP. We propose scheduling schemes for three modes of datapa...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
Analyzing the effect of crosstalk on delay is critical for high performance circuits. The major bottleneck in performing crosstalkinduced delay analysis is the high computational ...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
ICCD
2003
IEEE
14 years 22 days ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...