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ET
2007
13 years 8 months ago
2007
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
ISQED
2006
IEEE
14 years 2 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
ENGL
2007
13 years 8 months ago
2007
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
JISE
2000
13 years 8 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
DDECS
2006
IEEE
14 years 2 months ago
2006
IEEE
- Extension of a BIST design algorithm is proposed in this paper. The method is based on a synthesis of a combinational block - the decoder, transforming pseudo-random code words i...