52 search results - page 9 / 11 » isca 2010 |
ISCA
2010
IEEE
13 years 7 months ago
2010
IEEE
Due to their high volume, general-purpose processors, and now chip multiprocessors (CMPs), are much more cost effective than ASICs, but lag significantly in terms of performance a...
EAAI
2007
13 years 8 months ago
2007
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
TCAD
2010
13 years 3 months ago
2010
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...
ISQED
2010
IEEE
14 years 1 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
ASPDAC
2010
ACM
13 years 6 months ago
2010
ACM
This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enabl...