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ASPDAC
2005
ACM
14 years 1 months ago
2005
ACM
- Domino logic is used extensively in high speed microprocessor datapath design. Although domino gates have small propagation delay, they consume relatively more power. We propose ...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
Consideration of pairs of transition in probabilistic simulation allows power estimation for digital circuits in which inertial delays can filter glitches [5]. However, the merit ...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...