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DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper presents STAX, a crosstalk target set compaction framework to reduce the complexity of the crosstalk ATPG process by pruning non-fault-producing targets. In general, ex...
IOLTS
2006
IEEE
14 years 4 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
IPPS
2006
IEEE
14 years 4 months ago
2006
IEEE
In this work we present a system for implementing the placement and routing stages in the FPGA cycle of design, into the physical design stage. We start with the ISCAS benchmarks,...
VTS
2006
IEEE
14 years 4 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
ASPDAC
2006
ACM
14 years 4 months ago
2006
ACM
—Designing high-performance systems with high yield under parameter variations has raised serious design challenges in nanometer technologies. In this paper, we propose a profit-...