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26

ITC
1994
IEEE

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Transforming Behavioral Specifications to Facilitate Synthesis of Testable Designs

14 years 3 months ago

Transforming Behavioral Specifications to Facilitate Synthesis of Testable Designs

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Sujit Dey, Miodrag Potkonjak

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25

ITC
1994
IEEE

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Transparent Memory Testing for Pattern-Sensitive Faults

14 years 3 months ago

Transparent Memory Testing for Pattern-Sensitive Faults

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Mark G. Karpovsky, Vyacheslav N. Yarmolik

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27

ITC
1994
IEEE

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Making the Circular Self-Test Path Technique Effective for Real Circuits

14 years 2 months ago

Making the Circular Self-Test Path Technique Effective for Real Circuits

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Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda

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27

ITC
1994
IEEE

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An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms

14 years 2 months ago

An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms

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Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...

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27

ITC
1994
IEEE

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Simulation Results of an Efficient Defect-Analysis Procedure

14 years 3 months ago

Simulation Results of an Efficient Defect-Analysis Procedure

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For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...

Olaf Stern, Hans-Joachim Wunderlich

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