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    ITC
    1995
    IEEE
    98views Hardware» more  ITC 1995»
    Improved Boundary Scan Design
    13 years 11 months ago
    Improved Boundary Scan Design
    Download  www.itcprogramdev.org
    Lee Whetsel
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    ITC
    1995
    IEEE
    107views Hardware» more  ITC 1995»
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    13 years 11 months ago
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    Download  www.ece.mcgill.ca
    Xavier Haurie, Gordon W. Roberts
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    ITC
    1995
    IEEE
    95views Hardware» more  ITC 1995»
    Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
    13 years 11 months ago
    Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
    Download  cadlab.ece.ucsb.edu
    Kwang-Ting Cheng, Chih-Jen Lin
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    ITC
    1995
    IEEE
    116views Hardware» more  ITC 1995»
    An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design
    13 years 11 months ago
    An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design
    Download  www-crc.stanford.edu
    An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
    Piero Franco, William D. Farwell, Robert L. Stokes...
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    ITC
    1995
    IEEE
    124views Hardware» more  ITC 1995»
    An Experimental Chip to Evaluate Test Techniques: Experiment Results
    13 years 11 months ago
    An Experimental Chip to Evaluate Test Techniques: Experiment Results
    Download  www-crc.stanford.edu
    This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
    Siyad C. Ma, Piero Franco, Edward J. McCluskey
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