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29
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itc 1998
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1998
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An almost full-scan BIST solution-higher fault coverage and shorter test application time
15 years 7 months ago
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cadlab.ece.ucsb.edu
Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng
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1998
IEEE
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A fault injection environment for microprocessor-based boards
15 years 7 months ago
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www.cad.polito.it
Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo...
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1998
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Novel optical probing technique for flip chip packaged microprocessors
15 years 7 months ago
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japan.renesas.com
Mario Paniccia, Travis M. Eiles, V. R. M. Rao, Wai...
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1998
IEEE
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A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
15 years 7 months ago
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cad63.cs.nthu.edu.tw
Wen-Ben Jone, Jiann-Chyi Rau, Shih-Chieh Chang, Yu...
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85
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1998
IEEE
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A novel combinational testability analysis by considering signal correlation
15 years 6 months ago
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nthucad.cs.nthu.edu.tw
Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chi...
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