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    ITC
    1999
    IEEE
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    Testing a system-on-a-chip with embedded microprocessor
    15 years 7 months ago
    Testing a system-on-a-chip with embedded microprocessor
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    Rochit Rajsuman
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    ITC
    1999
    IEEE
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    High-level ATPG for Early Power Analysis
    15 years 7 months ago
    High-level ATPG for Early Power Analysis
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    Wolfgang Roethig
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    101
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    ITC
    1999
    IEEE
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    Addressable test ports an approach to testing embedded cores
    15 years 7 months ago
    Addressable test ports an approach to testing embedded cores
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    Lee Whetsel
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    ITC
    1999
    IEEE
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    Delay testing of SOI circuits: Challenges with the history effect
    15 years 7 months ago
    Delay testing of SOI circuits: Challenges with the history effect
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    Eric MacDonald, Nur A. Touba
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    ITC
    1999
    IEEE
    66views Hardware» more  ITC 1999»
    Robust testability of primitive faults using test points
    15 years 7 months ago
    Robust testability of primitive faults using test points
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    Ramesh C. Tekumalla, Premachandran R. Menon
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