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ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
ITC
1999
IEEE
14 years 3 months ago
1999
IEEE
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...