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itc 2000
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ITC
2000
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Analysis of interconnect crosstalk defect coverage of test sets
14 years 2 months ago
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esdat.ucsd.edu
Yi Zhao, Sujit Dey
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2000
IEEE
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Analysis of failure sources in surface-micromachined MEMS
14 years 2 months ago
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www.ece.cmu.edu
Nilmoni Deb, Ronald D. Blanton
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2000
IEEE
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A domain coverage metric for the validation of behavioral VHDL descriptions
14 years 2 months ago
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testlab.ics.uci.edu
Qiushuang Zhang, Ian G. Harris
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2000
IEEE
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Using on-chip test pattern compression for full scan SoC designs
14 years 2 months ago
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www.lirmm.fr
Helmut Lang, Jens Pfeiffer, Jeff Maguire
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2000
IEEE
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Power conscious test synthesis and scheduling for BIST RTL data paths
14 years 1 months ago
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dit.upc.es
Nicola Nicolici, Bashir M. Al-Hashimi
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