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ITC
2000
IEEE
14 years 3 months ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ITC
2000
IEEE
14 years 3 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ITC
2000
IEEE
14 years 3 months ago
2000
IEEE
—This paper presents Algorithm-level REcomputing with Shifted Operands (ARESO), which is a new register transfer (RT) level time redundancy-based concurrent error detection (CED)...
ITC
2000
IEEE
14 years 3 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...