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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
The long term impact of MEMS technology will be in its ability to integrate novel sensing and actuation functionality on traditional computing and communication devices enabling t...