106 search results - page 14 / 22 » itc 2003 |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
We present an efficient algorithm for identification of two-line bridges in combinational CMOS logic that narrows down the two-line bridge candidates based on tester responses for...