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ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper proposes an architecture for implementing a self-checking 4-bit carry select adder that can be extended to any n-bit addition. The overhead is directly proportional to ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper describes an Addressable Shadow Protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 11...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper describes a method for automatically generating diagnostic programs for mixed-signal load boards. This procedure employs a statistical method of computing Mahalanobis D...