106 search results - page 9 / 22 » itc 2003 |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
We propose a procedure for designing an LFSRbased circuit for masking of unknown output values that appear in the output response of a circuit tested using LBIST. The procedure is...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
In a carefully structured study spanning several months, the authors visited numerous companies focused on Design For Test methodologies in SoC Test, Characterization, and Failure...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of ...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...