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132
search results - page 3 / 27
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mr 2006
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Design of differential low-noise amplifier with cross-coupled-SCR ESD protection scheme
13 years 5 months ago
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www.ics.ee.nctu.edu.tw
Chun-Yu Lin, Ming-Dou Ker, Yuan-Wen Hsiao
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2006
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Reliability of large periphery GaN-on-Si HFETs
13 years 7 months ago
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www.nitronex.com
S. Singhal, T. Li, A. Chaudhari, A. W. Hanson, R. ...
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2006
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New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
13 years 7 months ago
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sdtlab.incheon.ac.kr
In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun ...
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MR
2007
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Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
13 years 7 months ago
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www.imec.be
The development of a simplified analytical model to describe the thermal history of a Printed Circuit Board assembly (PCA) during convective reflow soldering is described in this ...
Nele Van Steenberge, Paresh Limaye, Geert Willems,...
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2007
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Cohesive zone modeling for structural integrity analysis of IC interconnects
13 years 7 months ago
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www.mate.tue.nl
Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee...
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