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MR
2006
72views Robotics» more  MR 2006»
13 years 7 months ago
A reliability-driven placement procedure based on thermal-force model
This paper deals with placing chips on an MCM substrate in chip array style for minimizing the system failure rate. The placement procedure begins with constructing an initial pla...
Jing Lee
MR
2006
57views Robotics» more  MR 2006»
13 years 7 months ago
Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading
Interface reliability issue has become a major concern in developing flip chip assembly. The CTE mismatch between different material layers may induce severe interface delaminatio...
Y. L. Zhang, D. X. Q. Shi, W. Zhou
MR
2006
73views Robotics» more  MR 2006»
13 years 7 months ago
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
Deuterated oxides exhibit prolonged hot carrier lifetimes at room temperature. We report evidence that this improved hot carrier hardness exists over the temperature range between...
Cora Salm, André J. Hof, Fred G. Kuper, Jur...
MR
2006
108views Robotics» more  MR 2006»
13 years 7 months ago
Electronic circuit reliability modeling
The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review in...
Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, ...
MR
2002
87views Robotics» more  MR 2002»
13 years 7 months ago
Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies
Gold to Gold Interconnection (GGI) flip chip bonding technology has been developed to bond the driver IC chip on the integrated circuit suspension used in hard disk drives (HDDs)....
C. F. Luk, Y. C. Chan, K. C. Hung