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ISVLSI
2008
IEEE
14 years 4 months ago
2008
IEEE
The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
AIRS
2008
Springer
13 years 11 months ago
2008
Springer
Although regarded as one of the most successful algorithm to identify predictive features, Relief is quite vulnerable to outliers and noisy features. The recently proposed I-Relief...
FOSSACS
2008
Springer
13 years 11 months ago
2008
Springer
In recent years there have been several approaches for the automatic derivation of labels from an unlabeled reactive system. This can be done in such a way that the resulting bisim...
GLOBE
2008
Springer
13 years 10 months ago
2008
Springer
This paper addresses the problem of data integration in a P2P environment, where each peer stores schema of its local data, mappings between the schemas, and some schema constraint...