External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
: Linear Parameter Varying(LPV) systems appear in a form of LTI state space representations where the elements of the A(ρ), B(ρ), C(ρ) matrices can depend on an unknown but at a...
In a circuit environment that is becoming increasingly sensitive to dynamic power dissipation and noise, and where cycle time available for control decisions continues to decrease...
Hans M. Jacobson, Prabhakar Kudva, Pradip Bose, Pe...
The aggressive evolution of the semiconductor industry — smaller process geometries, higher densities, and greater chip complexity — has provided design engineers the means to...
Two decades ago, Megiddo and Dyer showed that linear programming in two and three dimensions (and subsequently any constant number of dimensions) can be solved in linear time. In ...