1840 search results - page 310 / 368 » time 2002 |
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
SACI
2007
IEEE
14 years 3 months ago
2007
IEEE
: Linear Parameter Varying(LPV) systems appear in a form of LTI state space representations where the elements of the A(ρ), B(ρ), C(ρ) matrices can depend on an unknown but at a...
ASYNC
2002
IEEE
14 years 2 months ago
2002
IEEE
In a circuit environment that is becoming increasingly sensitive to dynamic power dissipation and noise, and where cycle time available for control decisions continues to decrease...
CODES
2002
IEEE
14 years 2 months ago
2002
IEEE
The aggressive evolution of the semiconductor industry — smaller process geometries, higher densities, and greater chip complexity — has provided design engineers the means to...
FOCS
2002
IEEE
14 years 2 months ago
2002
IEEE
Two decades ago, Megiddo and Dyer showed that linear programming in two and three dimensions (and subsequently any constant number of dimensions) can be solved in linear time. In ...