Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Efficient VLSI implementation of multiple-input multiple-output (MIMO) detectors plays an important role in the real-life implementation of MIMO communication systems. However, m...
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
Jiang Brandon Liu, Magdy S. Abadir, Andreas G. Ven...
In many applications a software implementation of ECC (Elliptic Curve Cryptography) might be inappropriate due to performance requirements, therefore hardware implementations are ...