This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
This paper combines an adaptive supply-voltage scheme with self-timed CMOS digital design, to achieve low power performance. The supply-voltage automatically tracks the input data...
Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
Exploitation of silicon capacity will require improvements in design productivity and more scalable system paradigms. Asynchronous message passing networks on chip (NOC) have been...
Juha-Pekka Soininen, Axel Jantsch, Martti Forsell,...
The working-zone encoding (WZE) method employing locality of memory reference was previously proposed to reduce address bus switching activity. This paper presents an encoding met...