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VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
This paper combines an adaptive supply-voltage scheme with self-timed CMOS digital design, to achieve low power performance. The supply-voltage automatically tracks the input data...
VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
Exploitation of silicon capacity will require improvements in design productivity and more scalable system paradigms. Asynchronous message passing networks on chip (NOC) have been...
VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
The working-zone encoding (WZE) method employing locality of memory reference was previously proposed to reduce address bus switching activity. This paper presents an encoding met...