We present a new gate-level approach to current simulation. We use a symbolic model of current pulses that takes accurately into account the dependence on the switching conditions...
Alessandro Bogliolo, Luca Benini, Giovanni De Mich...
We present a dynamic programming technique for solving the multiple supply voltage scheduling problem in both nonpipelined and functionally pipelined data-paths. The scheduling pro...
We compare the frequency-versus-power dissipation performance of two energy-recovery CMOS implementations to that of a conventional, supply-voltage-scaled design. The application ...
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...