ISQED
2011
IEEE
13 years 3 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
ISQED
2011
IEEE
13 years 3 months ago
2011
IEEE
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
ISQED
2011
IEEE
13 years 3 months ago
2011
IEEE
The extent to which the 6T SRAM bit cell can be perpetuated through continued scaling is of enormous technological and economic importance. Understanding the growing limitations i...
ISQED
2011
IEEE
13 years 3 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
— The last two decades have seen many efficient algorithms and architectures for the design of low-complexity bit-parallel Multiple Constant Multiplications (MCM) operation, tha...
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
— we present an implementation of a programmable axonal propagation delay circuit which uses one first-order logdomain low-pass filter. Delays may be programmed in the 550ms rang...
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
— A switched-capacitor single-stage sigma-delta ADC with a fifth-order modulator is proposed. The proposed sigmadelta ADC employs feed-forward architecture with oversampling rati...
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
—Video enhancement has played very important roles in many applications. However, most existing enhancement methods only focus on the spatial quality within a frame while the tem...
ISCAS
2011
IEEE
13 years 3 months ago
2011
IEEE
— In this study, synchronization phenomena observed in coupled polygonal oscillatory networks with frustration is investigated. We focus on the power consumption of coupling resi...